000 | 00505cam a22001934a 4500 | ||
---|---|---|---|
999 |
_c31342 _d31342 |
||
005 | 20200817163113.0 | ||
008 | 000215s2001 nyua b 000 0 eng | ||
020 | _a9780471241416 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
082 |
_a539.216 _bAUC-I |
||
100 | _aEdited by- Auciello, Orlando | ||
245 | 0 | 0 | _aIn situ real time characterization of thin films |
260 |
_aNew York _bWiley _c2001 |
||
300 | _axi, 263p. | ||
650 | 0 | _aTHIN FLIMS | |
700 | 1 | _aKrauss, Alan R. | |
942 | _cBK |