000			00637nam a2200229Ia 4500
008			140908s9999 xx 000 0 und d
020			_a9780470027851
040			_aNISER LIBRARY
041			_aEnglish
082			_a620.3 _bBRA-M
100			_aBrandon, D
245			_aMicrostructural characterization of materials _cDavid Brandon and Wayne D. Kaplan
250			_a2nd ed.
260			_aNew Jersey _bWiley _c2008
300			_axiv,536p.
440			_aQuantitative software engineering series
500			_aRef. sec
650			_aMATERIALS-MICROSCOPY
650			_aMICROSTRUCTURE
700			_aKaplan, WD _4Auth.
942			_cBK
999			_c2778 _d2778