| 000 | 00590cam a2200205 i 4500 | ||
|---|---|---|---|
| 005 | 20170202171802.0 | ||
| 008 | 141125m20169999njua b 001 0 eng | ||
| 020 | _a9789814630351 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a537.533.35 _bREI-F |
||
| 100 | 1 | _aReifenberger, Ronald G. | |
| 245 | 1 | 0 | _aFundamentals of atomic force microscopy,Part 1:Foundations |
| 260 |
_aNew Jersey _bWorld Scientific _c2016 |
||
| 300 | _aXV, 324p.pbk. | ||
| 440 |
_aLessons from Nanoscience:Alecture note series _nVOL:4 |
||
| 650 | 0 | _aPHYSICS | |
| 650 | 0 | _aMICROSCOPY | |
| 942 | _cBK | ||
| 999 |
_c25091 _d25091 |
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