000 | 00644cam a2200229 i 4500 | ||
---|---|---|---|
005 | 20161130154321.0 | ||
008 | 780901s1978 nyu b 001 0 eng | ||
010 | _a 78010478 | ||
020 | _a0824766652 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
082 | 0 | 0 |
_a519.248 _bBAI-S |
100 | 1 | _aBain, Lee J. | |
245 | 1 | 0 | _aStatistical analysis of reliability and life-testing models: theory and methods |
260 |
_aNew York _bM. Dekker _c1978 |
||
300 | _axii, 450p. HB. | ||
440 | _aStatistics: textbooks and monographs, vol. 24 | ||
650 | 0 | _aMATHEMATICS | |
650 | 0 | _aRELIABILITY | |
650 | 0 | _aSTATISTICS | |
942 | _cBK | ||
999 |
_c24950 _d24950 |