000 00539nam a22001817a 4500
005 20140917162816.0
008 140917b xxu||||| |||| 00| 0 eng d
020 _a9780198570547
040 _aNISER LIBRARY
041 _aEnglish
082 _a536.48
_bEKI-E
100 _aEkin,Jack W
245 _aExperimental techniques low-temperature measurements
_bCryostat design,material properties, and superconductor critical-current testing
260 _aUSA
_bOxford
_c2006
300 _axxviii,673p. hb
650 _aPHYSICS
942 _cBK
999 _c20416
_d20416