| 000 | 00898nmm a2200277Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9783642166358, 978-3-642-16635-8 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a620.11, _b23 |
||
| 245 | _aX-Ray Diffraction Crystallography | ||
| 260 |
_aBerlin, Heidelberg _bSpringer Berlin Heidelberg _c2011. |
||
| 500 | _aChemistry and Materials Science (Springer-11644) | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aCrystallography | ||
| 650 | _aCrystallography | ||
| 650 | _aEngineering | ||
| 650 | _aMaterials Science | ||
| 650 | _aNanotechnology and Microengineering | ||
| 650 | _aSolid State Physics | ||
| 650 | _aSpectroscopy and Microscopy | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aWaseda, Yoshio., author. | ||
| 856 | _uhttp://dx.doi.org/10.1007/978-3-642-16635-8 | ||
| 942 | _cEB | ||
| 999 |
_c20181 _d20181 |
||