| 000 | 00872nmm a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9783642120121, 978-3-642-12012-1 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a620.11, _b23 |
||
| 245 | _aOptical Measurement of Surface Topography | ||
| 260 |
_aBerlin, Heidelberg _bSpringer Berlin Heidelberg _c2011. |
||
| 500 | _aChemistry and Materials Science (Springer-11644) | ||
| 650 | _aMicrowaves, RF and Optical Engineering | ||
| 650 | _aSurfaces and Interfaces, Thin Films | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aMaterials Science | ||
| 650 | _aMeasurement Science and Instrumentation | ||
| 650 | _aMicrowaves | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aLeach, Richard., editor. | ||
| 856 | _uhttp://dx.doi.org/10.1007/978-3-642-12012-1 | ||
| 942 | _cEB | ||
| 999 |
_c20104 _d20104 |
||