000			00996nmm a2200289Ia 4500
008			140908s9999 xx 000 0 und d
020			_a9783540738862, 978-3-540-73886-2
040			_aNISER LIBRARY
041			_aEnglish
245			_aTransmission Electron Microscopy and Diffractometry of Materials
250			_aThird Edition.
260			_aBerlin, Heidelberg _bSpringer Berlin Heidelberg _c2008.
500			_aChemistry and Materials Science (Springer-11644)
650			_aSurfaces and Interfaces, Thin Films
650			_aCharacterization and Evaluation of Materials
650			_aChemistry
650			_aChemistry
650			_aCrystallography
650			_aCrystallography
650			_aParticles (Nuclear physics)
650			_aPhysics and Applied Physics in Engineering
650			_aSolid State Physics and Spectroscopy
650			_aSurfaces (Physics)
700			_aFultz, Brent., author.
856			_uhttp://dx.doi.org/10.1007/978-3-540-73886-2
942			_cEB
999			_c19938 _d19938