000 | 00920nmm a2200277Ia 4500 | ||
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008 | 140908s9999 xx 000 0 und d | ||
020 | _a9781402086151, 978-1-4020-8615-1 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
082 |
_a620.11, _b23 |
||
245 | _aMicroscopy of Semiconducting Materials 2007 | ||
260 |
_aDordrecht _bSpringer Netherlands _c2008. |
||
500 | _aChemistry and Materials Science (Springer-11644) | ||
650 | _aElectronics and Microelectronics, Instrumentation | ||
650 | _aMaterials Science, general | ||
650 | _aMeasurement Science, Instrumentation | ||
650 | _aElectronics | ||
650 | _aMaterial Science | ||
650 | _aMaterials | ||
650 | _aParticles (Nuclear physics) | ||
650 | _aSolid State Physics and Spectroscopy | ||
650 | _aWeights and measures | ||
700 | _aCullis, A. G., editor. | ||
856 | _uhttp://dx.doi.org/10.1007/978-1-4020-8615-1 | ||
942 | _cEB | ||
999 |
_c19624 _d19624 |