| 000 | 00882nmm a2200277Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9780387396200, 978-0-387-39620-0 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a620.115, _b23 |
||
| 245 | _aScanning Microscopy for Nanotechnology | ||
| 260 |
_aNew York, NY _bSpringer New York _c2007. |
||
| 500 | _aChemistry and Materials Science (Springer-11644) | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aChemistry | ||
| 650 | _aChemistry | ||
| 650 | _aMeasurement Science and Instrumentation | ||
| 650 | _aNanotechnology | ||
| 650 | _aNanotechnology | ||
| 650 | _aOptical and Electronic Materials | ||
| 650 | _aOptical materials | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aZhou, Weilie., editor. | ||
| 856 | _uhttp://dx.doi.org/10.1007/978-0-387-39620-0 | ||
| 942 | _cEB | ||
| 999 |
_c19404 _d19404 |
||