| 000 | 01019nmm a2200313Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9780387292618, 978-0-387-29261-8 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 245 | _aFundamentals of Nanoscale Film Analysis | ||
| 260 |
_aBoston, MA _bSpringer US _c2007. |
||
| 500 | _aChemistry and Materials Science (Springer-11644) | ||
| 650 | _aElectronics and Microelectronics, Instrumentation | ||
| 650 | _aSurfaces and Interfaces, Thin Films | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aChemistry | ||
| 650 | _aChemistry | ||
| 650 | _aCondensed matter | ||
| 650 | _aCondensed Matter | ||
| 650 | _aElectronics | ||
| 650 | _aNanotechnology | ||
| 650 | _aNanotechnology | ||
| 650 | _aParticles (Nuclear physics) | ||
| 650 | _aSolid State Physics and Spectroscopy | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aAlford, Terry L., author. | ||
| 856 | _uhttp://dx.doi.org/10.1007/978-0-387-29261-8 | ||
| 942 | _cEB | ||
| 999 |
_c19367 _d19367 |
||