000 | 00872nmm a2200265Ia 4500 | ||
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008 | 140908s9999 xx 000 0 und d | ||
020 | _a9783540319153, 978-3-540-31915-3 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
245 | _aMicroscopy of Semiconducting Materials | ||
260 |
_aBerlin, Heidelberg _bSpringer Berlin Heidelberg _c2005. |
||
500 | _aPhysics and Astronomy (Springer-11651) | ||
650 | _aElectronics and Microelectronics, Instrumentation | ||
650 | _aMeasurement Science, Instrumentation | ||
650 | _aChemistry | ||
650 | _aChemistry | ||
650 | _aElectronics | ||
650 | _aMaterials Science | ||
650 | _aParticles (Nuclear physics) | ||
650 | _aSolid State Physics and Spectroscopy | ||
650 | _aWeights and measures | ||
700 | _aCullis, A. G., editor. | ||
856 | _uhttp://dx.doi.org/10.1007/3-540-31915-8 | ||
942 | _cEB | ||
999 |
_c15701 _d15701 |