000 | 00727nmm a2200229Ia 4500 | ||
---|---|---|---|
008 | 140908s9999 xx 000 0 und d | ||
020 | _a9781441965332, 978-1-4419-6533-2 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
082 |
_a620.11, _b23 |
||
245 | _aAdvanced Computing in Electron Microscopy | ||
260 |
_aBoston, MA _bSpringer US _c2010. |
||
500 | _aPhysics and Astronomy (Springer-11651) | ||
650 | _aCharacterization and Evaluation of Materials | ||
650 | _aComputer engineering | ||
650 | _aElectrical Engineering | ||
650 | _aMaterials Science | ||
650 | _aSurfaces (Physics) | ||
700 | _aKirkland, Earl J., author. | ||
856 | _uhttp://dx.doi.org/10.1007/978-1-4419-6533-2 | ||
942 | _cEB | ||
999 |
_c15361 _d15361 |