| 000 | 00872nmm a2200301Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9781402039201, 978-1-4020-3920-1 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a548, _b23 |
||
| 245 | _aElectron Crystallography | ||
| 260 |
_aDordrecht _bSpringer Netherlands _c2006. |
||
| 500 | _aPhysics and Astronomy (Springer-11651) | ||
| 650 | _aSurfaces and Interfaces, Thin Films | ||
| 650 | _aCatalysis | ||
| 650 | _aCatalysis | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aCrystallography | ||
| 650 | _aCrystallography | ||
| 650 | _aMineralogy | ||
| 650 | _aMineralogy | ||
| 650 | _aPhysics | ||
| 650 | _aPhysics | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aWeirich, Thomas E., editor. | ||
| 856 | _uhttp://dx.doi.org/10.1007/1-4020-3920-4 | ||
| 942 | _cEB | ||
| 999 |
_c15171 _d15171 |
||