Scanning electron microscopy and x-ray microanalysis
Material type: TextLanguage: English Publication details: New York: Springer, 2018. Edition: 4th edDescription: xxiii, 550p. pb. 28cmISBN: 9781493982691Subject(s): ELECTRON MICROSCOPY | X-RAY | PHYSICS | MICROSCOPEDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Book | NISER LIBRARY | 537.533.35 GOL-S (Browse shelf(Opens below)) | Available | 23135 |
There are no comments on this title.