Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer
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Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 620.3 ALF-F (Browse shelf(Opens below)) | Available | 21309 | |
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NISER LIBRARY | 620.3 ALF-F (Browse shelf(Opens below)) | R (REFERENCE) | 5848 |
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