TY  - BOOK
AU  - Fultz,Brent
AU  - Howe,James
TI  - Transmission electron microscopy and diffractometry of materials
T2  - Graduate texts in physics
SN  - 9783642297601
U1  - 537.533.35 
PY  - 2013///
CY  - New York
PB  - Springer
KW  - TRANSMISSION ELECTRON MICROSCOPY
KW  - X-RAY DIFFRACTOMETER
KW  - MATERIALS
KW  - MICROSCOPY
N1  - Table of contents

1.	Diffraction and the X-Ray Powder Diffractometer
2.	The TEM and Its Optics
3.	Neutron Scattering
4.	Scattering
5.	Inelastic Electron Scattering and Spectroscopy
6.	Diffraction from Crystals
7.	Electron Diffraction and Crystallography
8.	Diffraction Contrast in TEM Images
9.	Diffraction Lineshapes
10.	Patterson Functions and Diffuse Scattering
11.	High-Resolution TEM Imaging
12.	High-Resolution STEM and Related Imaging Techniques
13.	Dynamical Theory
N2  - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises
ER  -