TY - BOOK AU - Hazen, Robert M. (ed.) AU - Downs, Robert T. (ed.) TI - High-temperature and high-pressure crystal chemistry T2 - Reviews in mineralogy and geochemistry SN - 9780939950539 U1 - 550.425 PY - 2000/// CY - Washington PB - Mineralogical Society of America, KW - HIGH PRESSURE CRYSTALLOGRAPHY KW - CRYSTALLOGRAPHY KW - CRYSTALS--THERMAL PROPERTIES N1 - PART I: Characterization and Interpretation Of Structural Variations With Temperature And Pressure 1. Principles of Comparative Crystal Chemistry 2. Equations of State 3. Analysis of Harmonic Displacement Factors 4. Animation of Crystal Structure Variations with Pressure, Temperature and Composition Part II: Variation Of Structures With Temperature And Pressure 5. Systematics of High-Pressure Silicate Structures 6. Comparative Crystal Chemistry of Dense Oxide Minerals 7. Comparative Crystal Chemistry of Orthosilicate Minerals 8. Chain and Layer Silicates at High Temperatures and Pressures 9. Framework Structures 10. Structural Variations in Carbonates 11. Hydrous Phases and Hydrogen Bonding at High Pressure 12. Molecular Crystals Part III: Experimental Techniques 13. High-Temperature Devices and Environmental Cells Designed for X-ray and Neutron Diffraction Experiments 14. High-Pressure Single-Crystal Techniques 15. High-Pressure and High-Temperature Powder Diffraction 16. High-Temperature-High- Pressure Diffractometry N2 - Volume 41 of Reviews in Mineralogy and Geochemistry introduces to the field of high-temperature and high-pressure crystal chemistry, both as a guide to the dramatically improved techniques and as a summary of the voluminous crystal chemical literature on minerals at high temperature and pressure. The three parts of the book introduces crystal chemical considerations of special relevance to non-ambient crystallographic studies, reviews the temperature- and pressure-variation of structures in major mineral groups and presents experimental techniques for high-temperature and high-pressure studies of single crystals and polycrystalline samples as well as special considerations relating to diffractometry on samples at non-ambient conditions ER -