TY  - BOOK
AU  - Holt, DB
AU  - Joy, DC
TI  - Sem microcharacterization of semiconductors
SN  - 9780123538550
U1  - 537.311 
PY  - 1989///
CY  - London
PB  - Academic
KW  - ELECTRON BEAM
KW  - SEMICONDUCTOR DEVICES
KW  - TRANSIENT SPECTOSCOPY
N1  - vol.12
ER  -