TY  - BOOK
AU  - Kaupp, G
TI  - Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces
SN  - 9783540284055
U1  - 620.3 
PY  - 2006///
CY  - Berlin
PB  - Springer
KW  - ATOMIC FORCE MICROSCOPY
KW  - NANOSCRATCHING
KW  - OPTICAL-MICROSCOPY
KW  - POLYMERS
ER  -