TY  - BOOK
AU  - Bhakta, Sourav 
AU  - Sahoo, Pratap Kumar
TI  - Ion beam-induced defect phenomena in rock-salt crystals (MgO, NiO) for optical and electronic device applications
U1  - 537.8 
PY  - 2024///
CY  - Bhubaneswar
PB  - NISER
KW  - Ion beam
KW  - Rock-salt crystals
KW  - Optical device applications
KW  - Electronic device applications
KW  - Nanoelectronics
UR  - http://idr.niser.ac.in:8080/jspui/handle/123456789/652
ER  -