TY - BOOK AU - Reed, S. J. B. TI - Electron microprobe analysis and scanning electron microscopy in geology SN - 9780521142304 U1 - 55 PY - 2005/// CY - Cambridge PB - Cambridge University Press KW - Petrofabric analysis KW - Electron probe microanalysis KW - Scanning electron microscopy N1 - Table of Contents Preface Acknowledgements 1. Introduction 2. Electron-specimen interactions 3. Instrumentation 4. Scanning electron microscopy 5. X-ray spectrometers 6. Element mapping 7. X-ray analysis (1) 8. X-ray analysis (2) 9. Sample preparation Appendix References Index N2 - Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories ER -