TY  - BOOK
AU  - Goldstein, Joseph I
AU  - Newbury, Dale E
AU  - Michael, JR
AU  - Ritchie, N.W.M
AU  - Scott, J.H.J
AU  - Joy, David C
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9781493982691
U1  - 537.533.35 
PY  - 2018///
CY  - New York
PB  - Springer
KW  - ELECTRON MICROSCOPY
KW  - X-RAY
KW  - PHYSICS
KW  - MICROSCOPE
ER  -