TY  - BOOK
AU  - Edited by- Auciello, Orlando
AU  - Krauss,Alan R.
TI  - In situ real time characterization of thin films 
SN  - 9780471241416
U1  - 539.216 
PY  - 2001///
CY  - New York
PB  - Wiley
KW  - THIN FLIMS
ER  -