TY  - BOOK
AU  - Kalinin, S
AU  - Gruverman ,Alexei 
TI  - Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2
SN  - 9780387286679
U1  - 543.456 
PY  - 2007///
CY  - New work
PB  - Springer
KW  - KELVIN PROBE FORCE MICROSCOPY
KW  - SCANNING CAPACITANCE MICROSCOPY
N1  - Ref. sec
ER  -