TY  - DATA
AU  - Waseda, Yoshio., author.
TI  - X-Ray Diffraction Crystallography
SN  - 9783642166358, 978-3-642-16635-8
U1  - 620.11, 
PY  - 2011///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Characterization and Evaluation of Materials
KW  - Crystallography
KW  - Engineering
KW  - Materials Science
KW  - Nanotechnology and Microengineering
KW  - Solid State Physics
KW  - Spectroscopy and Microscopy
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-3-642-16635-8
ER  -