TY  - DATA
AU  - Shimizu, Kenichi., author.
TI  - New Horizons of Applied Scanning Electron Microscopy
SN  - 9783642031601, 978-3-642-03160-1
U1  - 620.44, 
PY  - 2010///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Surfaces and Interfaces, Thin Films
KW  - Engineering
KW  - Materials Science
KW  - Measurement Science and Instrumentation
KW  - Nanotechnology
KW  - Nanotechnology and Microengineering
KW  - Solid State Physics
KW  - Spectroscopy and Microscopy
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-3-642-03160-1
ER  -