TY  - DATA
AU  - Egerton, R.F., author.
TI  - Electron Energy-Loss Spectroscopy in the Electron Microscope
SN  - 9781441995834, 978-1-4419-9583-4
U1  - 620.11, 
PY  - 2011///
CY  - Boston, MA
PB  - Springer US
KW  - Characterization and Evaluation of Materials
KW  - Materials Science
KW  - Nanotechnology
KW  - Solid State Physics
KW  - Spectroscopy
KW  - Spectroscopy and Microscopy
KW  - Spectroscopy/Spectrometry
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-1-4419-9583-4
ER  -