TY  - DATA
AU  - Walkosz, Weronika., author.
TI  - Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
SN  - 9781441978172, 978-1-4419-7817-2
U1  - 620.14, 
PY  - 2011///
CY  - New York, NY
PB  - Springer New York
KW  - Ceramics, Glass, Composites, Natural Methods
KW  - Chemistry, Physical organic
KW  - Atomic/Molecular Structure and Spectra
KW  - Materials
KW  - Materials Science
KW  - Microengineering
KW  - Microreactors
KW  - Physical Chemistry
KW  - Spectroscopy and Microscopy
KW  - Structural Materials
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-1-4419-7817-2
ER  -