TY  - DATA
AU  - Cullis, A. G., editor.
TI  - Microscopy of Semiconducting Materials 2007
SN  - 9781402086151, 978-1-4020-8615-1
U1  - 620.11, 
PY  - 2008///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - Electronics and Microelectronics, Instrumentation
KW  - Materials Science, general
KW  - Measurement Science, Instrumentation
KW  - Electronics
KW  - Material Science
KW  - Materials
KW  - Particles (Nuclear physics)
KW  - Solid State Physics and Spectroscopy
KW  - Weights and measures
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-1-4020-8615-1
ER  -