TY  - DATA
AU  - Williams, David B., author.
TI  - Transmission Electron Microscopy
SN  - 9780387765013, 978-0-387-76501-3
U1  - 620.11, 
PY  - 2009///
CY  - Boston, MA
PB  - Springer US
KW  - Characterization and Evaluation of Materials
KW  - Continuum Mechanics and Mechanics of Materials
KW  - Materials
KW  - Materials Science
KW  - Nanotechnology
KW  - Solid State Physics
KW  - Spectroscopy and Microscopy
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-0-387-76501-3
ER  -