TY  - DATA
AU  - Pelliccione, Matthew., author.
TI  - Evolution of Thin Film Morphology
SN  - 9780387751092, 978-0-387-75109-2
U1  - 620.44, 
PY  - 2008///
CY  - New York, NY
PB  - Springer New York
KW  - Chemistry, inorganic
KW  - Surfaces and Interfaces, Thin Films
KW  - Tribology, Corrosion and Coatings
KW  - Chemistry
KW  - Optical and Electronic Materials
KW  - Optical materials
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-0-387-75109-2
ER  -