TY  - DATA
AU  - Zhou, Weilie., editor.
TI  - Scanning Microscopy for Nanotechnology
SN  - 9780387396200, 978-0-387-39620-0
U1  - 620.115, 
PY  - 2007///
CY  - New York, NY
PB  - Springer New York
KW  - Characterization and Evaluation of Materials
KW  - Chemistry
KW  - Measurement Science and Instrumentation
KW  - Nanotechnology
KW  - Optical and Electronic Materials
KW  - Optical materials
KW  - Surfaces (Physics)
N1  - Chemistry and Materials Science (Springer-11644)
UR  - http://dx.doi.org/10.1007/978-0-387-39620-0
ER  -