TY  - BOOK
AU  - Birkhoz, Mario 
AU  - Fewster, Paul F. 
TI  - Thin films analysis by x-ray scattering
SN  - 978352731052
U1  - 539.216:535.34 
PY  - 2006///
CY  - Weinheim
PB  - Wiley 
KW  - FILM ANALYSIS
KW  - X RAY SCATTERING
ER  -