TY  - DATA
AU  - Cullis, A. G., editor.
TI  - Microscopy of Semiconducting Materials
SN  - 9783540319153, 978-3-540-31915-3
PY  - 2005///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Electronics and Microelectronics, Instrumentation
KW  - Measurement Science, Instrumentation
KW  - Chemistry
KW  - Electronics
KW  - Materials Science
KW  - Particles (Nuclear physics)
KW  - Solid State Physics and Spectroscopy
KW  - Weights and measures
N1  - Physics and Astronomy (Springer-11651)
UR  - http://dx.doi.org/10.1007/3-540-31915-8
ER  -