TY  - DATA
AU  - Seebauer, Edmund G., author.
TI  - Charged Semiconductor Defects
SN  - 9781848820593, 978-1-84882-059-3
U1  - 530.41, 
PY  - 2009///
CY  - London
PB  - Springer London
KW  - Electronics and Microelectronics, Instrumentation
KW  - Engineering Thermodynamics, Transport Phenomena
KW  - Continuum Mechanics and Mechanics of Materials
KW  - Electronics
KW  - Materials
KW  - Optical and Electronic Materials
KW  - Optical materials
KW  - Particles (Nuclear physics)
KW  - Physics
KW  - Solid State Physics and Spectroscopy
N1  - Physics and Astronomy (Springer-11651)
UR  - http://dx.doi.org/10.1007/978-1-84882-059-3
ER  -