TY  - DATA
AU  - Kirkland, Earl J., author.
TI  - Advanced Computing in Electron Microscopy
SN  - 9781441965332, 978-1-4419-6533-2
U1  - 620.11, 
PY  - 2010///
CY  - Boston, MA
PB  - Springer US
KW  - Characterization and Evaluation of Materials
KW  - Computer engineering
KW  - Electrical Engineering
KW  - Materials Science
KW  - Surfaces (Physics)
N1  - Physics and Astronomy (Springer-11651)
UR  - http://dx.doi.org/10.1007/978-1-4419-6533-2
ER  -