TY  - DATA
AU  - Weirich, Thomas E., editor.
TI  - Electron Crystallography
SN  - 9781402039201, 978-1-4020-3920-1
U1  - 548, 
PY  - 2006///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - Surfaces and Interfaces, Thin Films
KW  - Catalysis
KW  - Characterization and Evaluation of Materials
KW  - Crystallography
KW  - Mineralogy
KW  - Physics
KW  - Surfaces (Physics)
N1  - Physics and Astronomy (Springer-11651)
UR  - http://dx.doi.org/10.1007/1-4020-3920-4
ER  -