Thin film fundamentals A. Goswami
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Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 539.216 GOS-T (Browse shelf(Opens below)) | Available | 10134 | |
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NISER LIBRARY | 539.216 GOS-T (Browse shelf(Opens below)) | Available | 10135 | |
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NISER LIBRARY | 539.216 GOS-T (Browse shelf(Opens below)) | R (REFERENCE) | 10136 | |
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NISER LIBRARY | 539.216 GOS-T (Browse shelf(Opens below)) | Available | 10137 | |
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NISER LIBRARY | 539.216 GOS-T (Browse shelf(Opens below)) | Available | 10138 |
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539.216 FRE-T Thin film materials :stress,defect formation and surface evolution | 539.216 FRE-T Thin film materials :stress,defect formation and surface evolution | 539.216 FRI-S Surface and thin film analysis: a compendium of principles, Instrumentation and applications | 539.216 GOS-T Thin film fundamentals | 539.216 GOS-T Thin film fundamentals | 539.216 GOS-T Thin film fundamentals | 539.216 GOS-T Thin film fundamentals |
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