Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 537:535-2 SAS-E (Browse shelf(Opens below)) | R (REFERENCE) | 4140 |
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537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science | 537:535-2 SAS-E Electricity, magnetism and light | 537.568 ABR-E Electron paramagnetic resonance of transition ions | 537.568 ABR-E Electron paramagnetic resonance of transition ions | 537.6 ANU-O Observation of WAL and proximity effect in Bi2 (Se/Te)3 topological insulator superconductor junctions |
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