Ion beam-induced defect phenomena in rock-salt crystals (MgO, NiO) for optical and electronic device applications
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 537.8 BHA-I (Browse shelf(Opens below)) | Not for loan | T622 |
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