Atomic force microscopy/sxcanning tunneling microscopy 2 edited by Samuel H. Cohen and Marcia L. Lightbody
Material type:
TextLanguage: English Publication details: New York plenum 1997 Description: ix, 250pISBN: 9780306455964Subject(s): ATOMIC FORCE MICROSCOPOY | SCANNING TUNNELING MICROSCOPYDDC classification: 537.533.35
| Item type | Current library | Call number | Status | Date due | Barcode |
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Book
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NISER LIBRARY | 537.533.35 COH-A (Browse shelf(Opens below)) | R (REFERENCE) | 8522 | |
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Book
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NISER LIBRARY | 537.533.35 COH-A (Browse shelf(Opens below)) | Available | 8523 |
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| 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 | 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 |
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