Transmission electron microscopy:a textbook for materials science
Material type: TextLanguage: English Publication details: New York Springer 2009 Edition: 2nd edDescription: lxii, 760p. pbkISBN: 9780387765006 Subject(s): PHYSICS | ELECTRON MICROSCOPYDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 WIL-T (Browse shelf(Opens below)) | R (REFERENCE) | 16893 | |
Book | NISER LIBRARY | 537.533.35 WIL-T (Browse shelf(Opens below)) | Available | 16894 |
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537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science | 537:535-2 SAS-E Electricity, magnetism and light | 537.568 ABR-E Electron paramagnetic resonance of transition ions |
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