Noncontact atomic force microscopy: vol.2 edited by S. Morita, F.J. Giessibl, R. Wiesesndanger

By: Morita, SContributor(s): Giessibl, FJ [Auth.]Material type: Text

TextLanguage: English Series: Nanoscience and technologyPublication details: Berlin Springer 2009 Description: xviii, 401pISBN: 9783642014949Subject(s): ATOMIC FORCE MICROSCOPY | MICROSCOPYDDC classification: 537.533.35

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 MOR-N (Browse shelf(Opens below))	Available		8537

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Previous	537.533.35 GOL-S Scanning electron microscopy and x-ray microanalysis	537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications	537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications	537.533.35 MOR-N Noncontact atomic force microscopy: vol.2	537.533.35 MOR-N Noncontact atomic force microscopy: vol.2	537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis	537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis	Next

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