Scanning Transmission Electron Microscopy:imaging and analysis
Material type: Computer fileLanguage: English Publication details: New York Springer 2011. Description: XII, 762p. hbkISBN: 9781441971999Subject(s): PHYSICS | Electron microscopyDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 PEN-S (Browse shelf(Opens below)) | R (REFERENCE) | 16891 | |
Book | NISER LIBRARY | 537.533.35 PEN-S (Browse shelf(Opens below)) | Available | 16892 | |
E(electronic)-Books | NISER LIBRARY | 620.11295, 23 620.11297 23 (Browse shelf(Opens below)) | Available | E7541 |
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537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications | 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 | 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 | 537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations |
Chemistry and Materials Science (Springer-11644)
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