Narrow Gap Semiconductors 2007
Material type:
Computer fileLanguage: English Publication details: Dordrecht Springer Netherlands 2008. ISBN: 9781402084256, 978-1-4020-8425-6Subject(s): Applied Optics, Optoelectronics, Optical Devices | Engineering, general | Characterization and Evaluation of Materials | Engineering | Material Science | Materials | Optical and Electronic Materials | Optical materials | Physical optics | Surfaces (Physics)DDC classification: 620.11295, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
|
NISER LIBRARY | 620.11295, 23 620.11297 23 (Browse shelf(Opens below)) | Available | E7477 |
Browsing NISER LIBRARY shelves Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | |||
| 620.11295, 23 620.11297 23 Phase Change Materials | 620.11295, 23 620.11297 23 Sapphire | 620.11295, 23 620.11297 23 Nanoscaled Semiconductor-on-Insulator Structures and Devices | 620.11295, 23 620.11297 23 Narrow Gap Semiconductors 2007 | 620.11295, 23 620.11297 23 Magnetic Oxides | 620.11295, 23 620.11297 23 TiO2 Nanotube Arrays | 620.11295, 23 620.11297 23 Scanning Transmission Electron Microscopy:imaging and analysis |
Chemistry and Materials Science (Springer-11644)
There are no comments on this title.