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Transmission Electron Microscopy

Contributor(s): Williams, David B., authorMaterial type: Computer fileComputer fileLanguage: English Publication details: Boston, MA Springer US 2009. Edition: 2ISBN: 9780387765013, 978-0-387-76501-3Subject(s): Characterization and Evaluation of Materials | Continuum Mechanics and Mechanics of Materials | Materials | Materials Science | Nanotechnology | Nanotechnology | Solid State Physics | Spectroscopy and Microscopy | Surfaces (Physics)DDC classification: 620.11, Online resources: Click here to access online
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