Thin films analysis by x-ray scattering Mario Birkholz
Material type: TextLanguage: English Publication details: Weinheim Wiley 2006 Description: xxii,356pISBN: 978352731052Subject(s): FILM ANALYSIS | X RAY SCATTERINGDDC classification: 539.216:535.34Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 539.216:535.34 BIR-T (Browse shelf(Opens below)) | Available | 7913 | |
Book | NISER LIBRARY | 539.216:535.34 BIR-T (Browse shelf(Opens below)) | Available | 7914 |
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539.216 WAG-I Introduction to physics and technology of thin films(an) | 539.216 WAG-I Introduction to physics and technology of thin films(an) | 539.216 WAS-T Thin film materials technology: sputtering of compound materials | 539.216:535.34 BIR-T Thin films analysis by x-ray scattering | 539.216:535.34 BIR-T Thin films analysis by x-ray scattering | 539, 23 Springer Handbook of Atomic, Molecular, and Optical Physics | 539, 23 Electron Scattering |
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