Atomic force microscopy/scanning tunneling microscopy edited by Samuel H. Cohen, Mona T. Bray and Marcia L. Lightbody

By: Cohen, SHContributor(s): Bray, MT [Auth.]Material type: Text

TextLanguage: English Publication details: New York plenum 1994 Description: 452pISBN: 9780306448904Subject(s): ATOMIC FORCE MICROSCOPOY | SCANNING TUNNELING MICROSCOPYDDC classification: 537.533.35

List(s) this item appears in: Physics

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 COH-A (Browse shelf(Opens below))	R (REFERENCE)		8813

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Previous	537.533.35 AYA-S Sample preparation handbook for transmission electron microscopy techniques	537.533.35 CAR-T Transmission electron microscopy : diffraction, imaging, and spectrometry	537.533.35 CAR-T Transmission electron microscopy: diffraction, imaging, and spectrometry	537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy	537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an)	537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an)	537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an)	Next

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