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Handbook of sample preparation for scanning elctrons......microanalysis (Record no. 7444)

MARC details
000 -LEADER
fixed length control field 00579nam a2200193Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140908s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780387857305
040 ## - CATALOGING SOURCE
Original cataloging agency NISER LIBRARY
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title English
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 543(035)
Item number ECH-H
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Echlin, P
245 ## - TITLE STATEMENT
Title Handbook of sample preparation for scanning elctrons......microanalysis
Statement of responsibility, etc. P. Echlin
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. UK
Name of publisher, distributor, etc. Springer
Date of publication, distribution, etc. 2009
300 ## - PHYSICAL DESCRIPTION
Extent xi,330p.
500 ## - GENERAL NOTE
General note Includes bibliographical references and index. (Ref. sec)
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element SAMPLE PREPARATION TOOLS.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element X-RAY MICROANALYSIS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
      R (REFERENCE) NISER LIBRARY NISER LIBRARY 09/09/2014   543(035) ECH-H 5901 09/09/2014 09/09/2014 Book
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