Handbook of sample preparation for scanning elctrons......microanalysis (Record no. 7444)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 00579nam a2200193Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 140908s9999 xx 000 0 und d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780387857305 |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | NISER LIBRARY |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | English |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 543(035) |
Item number | ECH-H |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Echlin, P |
245 ## - TITLE STATEMENT | |
Title | Handbook of sample preparation for scanning elctrons......microanalysis |
Statement of responsibility, etc. | P. Echlin |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | UK |
Name of publisher, distributor, etc. | Springer |
Date of publication, distribution, etc. | 2009 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xi,330p. |
500 ## - GENERAL NOTE | |
General note | Includes bibliographical references and index. (Ref. sec) |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | SAMPLE PREPARATION TOOLS. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | X-RAY MICROANALYSIS |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Book |
Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
---|---|---|---|---|---|---|---|---|---|---|---|---|
R (REFERENCE) | NISER LIBRARY | NISER LIBRARY | 09/09/2014 | 543(035) ECH-H | 5901 | 09/09/2014 | 09/09/2014 | Book |